Sec S3c2443x Test B D Driver Sec S3c2443x Test B D Driver Sec S3c2443x Test B D Driver Sec S3c2443x Test B D Driver Sec S3c2443x Test B D Driver Sec S3c2443x Test B D Driver

Sec S3c2443x Test B D Driver Here

/* 2. Request IRQ */ ret = devm_request_irq(&pdev->dev, platform_get_irq(pdev, 0), sec_testbd_isr, 0, dev_name(&pdev->dev), testbd); if (ret) return ret;

/* 4. Register char device */ ret = alloc_chrdev_region(&dev_num, 0, 1, "sec_testbd"); if (ret) return ret; cdev_init(&testbd->cdev, &sec_testbd_fops); testbd->cdev.owner = THIS_MODULE; ret = cdev_add(&testbd->cdev, dev_num, 1); if (ret) goto err_unregister; Sec S3c2443x Test B D Driver

| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation | */ __u32 mode; /* ENCRYPT, DECRYPT, HASH */

struct sec_testbd_crypto_req __u32 algo; /* SEC_ALGO_AES256, SEC_ALGO_SHA256, etc. */ __u32 mode; /* ENCRYPT, DECRYPT, HASH */ __u64 key_addr; /* Physical address of key material */ __u64 src_addr; /* Input data buffer */ __u64 dst_addr; /* Output buffer (or NULL for hash) */ __u32 length; /* Data length */ ; The driver programs the CE registers, starts the operation, and returns the status. The CE can process up to 64 KB per command; larger payloads are automatically split. The driver provides a special ioctl SEC_TESTBD_IOCTL_STRESS that configures the internal test logic: Errors such as address misalignment or length overflow

struct sec_testbd_dma_desc SEC_TESTBD_DMA_DECRYPT */ ; The driver writes the descriptor into the SMI registers, triggers the transfer, and waits for the completion interrupt. Errors such as address misalignment or length overflow generate -EINVAL . Through SEC_TESTBD_IOCTL_CRYPTO , the user can request a single‑shot operation: